Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-12-25
2007-12-25
Mis, David (Department: 2817)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
11388002
ABSTRACT:
A computer implemented method, testing system, computer usable program code, and apparatus are provided for measuring microprocessor susceptibility to internal noise A noise generator modulates a clock signal to generate noise on a targeted component within a microprocessor. A function generator executes microprocessor functions on a plurality of functional components within the microprocessor. A maximum execution frequency on the plurality of functional components is then measured and a set of frequency ranges where the functional components are susceptible to the generated noise is determined.
REFERENCES:
patent: 5499250 (1996-03-01), Ingalls et al.
patent: 2003/0151464 (2003-08-01), Gauthier et al.
patent: 2003/0154453 (2003-08-01), Gauthier et al.
Chun Sungjun
Skergan Timothy M.
Tong Ching Lung
Weekly Roger Donell
International Business Machines - Corporation
Lammes Francis
Mis David
Tyson Tom
Yee Duke W.
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