Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-07-22
2008-07-22
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C702S118000, C702S123000
Reexamination Certificate
active
07404122
ABSTRACT:
A circuit and method for efficiently configuring an ACAM Select RAM for an ACAM circuit of a tester that tests multiple devices under test (DUTs).
REFERENCES:
patent: 6130546 (2000-10-01), Azizi
patent: 6671844 (2003-12-01), Krech et al.
patent: 6963208 (2005-11-01), Fukasawa et al.
patent: 2002/0049554 (2002-04-01), Miller
patent: 2002/0173926 (2002-11-01), McCord
Agilent Technologie,s Inc.
Bobys Marc
Ton David
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