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Electrical diagnostic circuit and method for the testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic circuit and integrated circuit including scan...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic circuit and method for testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic circuit comprising a test mode secured by...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic circuit testing methods and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic circuit with asynchronously operating components

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic circuit with asynchronously operating components

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic device selectably operable as a sequential logic circ

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Electronic element comprising an electronic circuit which is...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic system for testing a set of multiple chips...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic system for testing chips having a selectable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronic system having a chip integrated power-on reset circui

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Electronic system with self-test function and simulation...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Electronics testing circuit and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Embedded field programmable gate array for performing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Embedded micro computer unit (MCU) for high-speed testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Embedded processor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Embedded sequence checking

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Embedded testing capability for integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Embedded testing capability for integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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