Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-04-19
2005-04-19
Ton, David (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S733000
Reexamination Certificate
active
06883129
ABSTRACT:
An integrated circuit is switchable between a normal operating mode and a test mode. A functional circuit and a test pattern converter are both coupled between input contacts, output contacts and a redefinable contact of the integrated circuit. In the test mode respectively the test pattern converter drives the outputs contacts and, dependent on the circuit configuration, the redefinable contact. The test pattern converter is arranged to provide a first and second relation between signals at the input contacts and the output contacts, with the redefinable contact used as an input or output contact respectively, dependent on the circuit configuration. The relations have been selected so as to permit testing of stuck-at and cross-connect errors with the redefinable contact used as input and output contact respectively.
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Biewenga Alexander Sebastian
De Jong Franciscus Gerardus Maria
Lousberg Guillaume Elisabeth Andreas
Van De Logt Leon Albertus
Jure Michael
Ton David
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