Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-04-12
2011-04-12
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S710000, C714S711000, C714S025000, C714S030000, C714S048000, C714S715000, C714S718000, C714S719000, C714S720000, C714S724000, C714S726000, C714S735000, C714S738000, C714S799000, C365S200000, C365S201000, C702S117000, C702S118000
Reexamination Certificate
active
07925949
ABSTRACT:
Electronic apparatus, systems, and methods of operating and constructing the electronic apparatus and/or systems include an embedded processor disposed in a logic chip to direct, among other functions, self-testing of an electronic device structure in conjunction with a pattern buffer disposed in the logic chip, when the electronic device structure is coupled to the logic chip. Additional apparatus, systems, and methods are disclosed.
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Micro)n Technology, Inc.
Schwegman Lundberg & Woessner, P.A.
Trimmings John P
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