Embedded micro computer unit (MCU) for high-speed testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S733000

Reexamination Certificate

active

11013116

ABSTRACT:
Provided are an embedded micro computer unit (MCU) using a memory emulation module and a method of testing the embedded MCU. The embedded MCU includes an internal memory that is connected to bus master devices for storing temporary data of the bus master devices and a test vector in a test mode, a memory controller for accessing the internal memory or an external memory when a processor core is operated, and a memory emulation module that is connected between the memory controller and the internal memory for storing the test vector in the internal memory in the test mode.

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patent: 1020030023850 (2003-03-01), None
patent: 03-056186 (2003-07-01), None

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