Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-05-22
2007-05-22
Ton, David (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S733000
Reexamination Certificate
active
11013116
ABSTRACT:
Provided are an embedded micro computer unit (MCU) using a memory emulation module and a method of testing the embedded MCU. The embedded MCU includes an internal memory that is connected to bus master devices for storing temporary data of the bus master devices and a test vector in a test mode, a memory controller for accessing the internal memory or an external memory when a processor core is operated, and a memory emulation module that is connected between the memory controller and the internal memory for storing the test vector in the internal memory in the test mode.
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F. Chau & Associates LLC
Ton David
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