Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-12-19
2006-12-19
Kerveros, James C. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
07152193
ABSTRACT:
A circuit generally including a control function and a checksum function is disclosed. The control function may be configured to assert (i) a start signal in response to a signal having a predetermined sequence of values matching an entry value and (ii) a stop signal in response to the signal matching an exit value. The checksum function may be configured to (i) generate a checksum value for the signal between assertions of the start signal and the stop signal and (ii) generate a result signal in response to comparing the checksum value with an expected value.
REFERENCES:
patent: 4534030 (1985-08-01), Paez et al.
MIPS Technologies, “EJTAG Specification”, Document No. MD00047, Revision 2.60, Feb. 15, 2001, pp. 1-130.
Cubiss Christopher
Watkins Daniel R.
Kerveros James C.
LSI Logic Corporation
Maiorana P.C. Christopher P.
LandOfFree
Embedded sequence checking does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Embedded sequence checking, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Embedded sequence checking will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3704987