Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-08-11
2010-10-12
Ellis, Kevin L (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S724000, C324S765010, C365S201000, C716S030000
Reexamination Certificate
active
07814384
ABSTRACT:
An electrical diagnostic circuit and testing method is disclosed. In one embodiment, the electrical diagnostic circuit for testing an integrated circuit includes a number of external inputs, a plurality of essentially similar, series-connected switching units and a circuit output. The switching units are constructed to be controllable in such a manner that an input signal present at the internal input of the switching unit, in dependence on a control signal of the switching unit, can either be forwarded unchanged to the internal input of the switching unit in each case arranged downstream, or can be combined with the test signal in each case present at the external input.
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Goessel Michael
Leininger Andreas
Dicke Billig & Czaja, PLLC
Ellis Kevin L
Infineon - Technologies AG
Merant Guerrier
LandOfFree
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