Electrical diagnostic circuit and method for the testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S724000, C324S765010, C365S201000, C716S030000

Reexamination Certificate

active

07814384

ABSTRACT:
An electrical diagnostic circuit and testing method is disclosed. In one embodiment, the electrical diagnostic circuit for testing an integrated circuit includes a number of external inputs, a plurality of essentially similar, series-connected switching units and a circuit output. The switching units are constructed to be controllable in such a manner that an input signal present at the internal input of the switching unit, in dependence on a control signal of the switching unit, can either be forwarded unchanged to the internal input of the switching unit in each case arranged downstream, or can be combined with the test signal in each case present at the external input.

REFERENCES:
patent: 4503537 (1985-03-01), McAnney
patent: 4601034 (1986-07-01), Sridhar
patent: 5081626 (1992-01-01), Scott
patent: 5230000 (1993-07-01), Mozingo et al.
patent: 5574733 (1996-11-01), Kim
patent: 5745500 (1998-04-01), Damarla et al.
patent: 5831992 (1998-11-01), Wu
patent: 5930270 (1999-07-01), Forlenza et al.
patent: 6055660 (2000-04-01), Meaney
patent: 6158033 (2000-12-01), Wagner et al.
patent: 6442723 (2002-08-01), Koprowski et al.
patent: 6510398 (2003-01-01), Kundu et al.
patent: 7644333 (2010-01-01), Hill et al.
patent: 19929546 (2000-09-01), None
patent: 01/38889 (2001-05-01), None
Laung-Terng Wang, “Autonomous Linear Feedback Shift Register with On-Line Fault-Detection Capability”, 1982 IEEE, XP 000746113, pp. 311-314.
IBM Technical Disclosure Bulletin, “Reconfigurable Linear Feedback Shift Register”, vol. 34 No. 6 Nov. 1991, XP 000212785, pp. 377-380.
P.H. Bardell, W.H. Mc Anney und J. Savir, “Built-In Test for VLSI: Pseudorandom Techniques”, New York, 1987, pp. 285-287.
M. Abromovici, M.A. Breuer, A.D. Friedman; “Digital Systems Testing and Testable Design”, Computer Science Press, pp. 365-382.
L. Voelkel, J. Pliquett; “Theore-tische Grundlagen und Probleme—Ausblick und Anwendungen”; Akade-mie-Verlag Berlin 1988 Standard Literature.
Shu Lin, D.J. Costello; “Error Control Coding, Fundamentals and Applications”, New Jersey 07632 pp. 79-85.
Gerner, M. Muller, B.: Sandweg, G.: Selbsttest digitaler Schaltungen. Munchen (u.a.): Oldenbourg, 1990, p. 100-117, 140-151.
Internet Page http://www.adobe.com/products/acrobat/readste2.html of Dec. 17, 2001 (reconstructed by http://www.archive.org).

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