Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1997-11-26
2000-10-17
Tu, Trinh L.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
327396, 327401, G01R 3128
Patent
active
061346888
ABSTRACT:
An electronic device, with a plurality of logic stages for functional collaboration, is provided with selection means for selectively operating the plurality of stages to form either a sequential logic circuit or a combinatorial logic circuit. This enables conversion of sequential logic circuitry into combinatorial logic circuitry for the purpose of effective I.sub.DDQ -testing.
REFERENCES:
patent: 4357703 (1982-11-01), Van Brunt
patent: 4366393 (1982-12-01), Kasuya
patent: 4424581 (1984-01-01), Kawai
patent: 4855669 (1989-08-01), Mahoney
patent: 5317205 (1994-05-01), Sato
patent: 5396498 (1995-03-01), Lestrat et al.
patent: 5425034 (1995-06-01), Ozaki
patent: 5459735 (1995-10-01), Narimatsu
patent: 5459736 (1995-10-01), Nakamura
patent: 5533032 (1996-07-01), Johnson
"Current VS. Logic Testability of Bridges In Scan Chains" R. Rodriguez-Montanes et al, IEEE Proc. European Test Conf. Rotterdam, The Netherlands 1993, pp. 392-396.
PL22V10 In Philips Data Handbook IC13, Programmable Logic Devices (PLD) 1992, pp. 137-141.
Tu Trinh L.
U.S. Philips Corporation
Wieghaus Brian J.
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