Post image techniques
Post-mission test method for checking the integrity of a...
Power gating in integrated circuits for leakage reduction
Power reduction in scannable D-flip-flop with synchronous...
Pre-stored digital word generator
Probeless testing of pad buffers on wafer
Probeless testing of pad buffers on wafer
Probeless testing of pad buffers on wafer
Probing system for integrated circuit devices
Process and circuit arrangement for monitoring the function of a
Process of controlling plural test access ports
Processor emulator transferring data with emulation...
Processor to JTAG test access port interface
Production interface for an integrated circuit test system
Program analyzing apparatus which categorizes variables into dom
Program debugging support device
Program patching of a ROM
Program, test apparatus and testing method
Program-controlled unit and method for identifying and/or...
Programmable array built-in self test method and controller...