Probing system for integrated circuit devices

Details Probing system for integrated circuit devices Probing system for integrated circuit devices

2011-03-08

2011-03-08

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S733000, C714S030000, C714S726000, C714S799000, C714S734000, C324S754120, C324S500000, C340S635000, C455S073000, C455S067110

Reexamination Certificate

active

07904768

ABSTRACT:
A probing system for an integrated circuit device, which transmits a testing data/signal between an automatic test equipment (ATE) and an integrated circuit device, is disclosed. The probing system includes a test head having a first transceiving module. There is a test station having a test unit coupled to the test head to perform a test operation. A communication module has a second transceiving module configured to exchange data with the first transceiving module in a wireless manner. There is an integrated circuit device having a core circuit being tested, and a test module having a self-test circuit coupled to the core circuit and the communication module for performing the core circuit self-testing.

REFERENCES:
patent: 5216361 (1993-06-01), Akar et al.
patent: 6236223 (2001-05-01), Brady et al.
patent: 6349396 (2002-02-01), Akram
patent: 6357025 (2002-03-01), Tuttle
patent: 6412086 (2002-06-01), Friedman et al.
patent: 6563301 (2003-05-01), Gventer
patent: 7057518 (2006-06-01), Schmidt
patent: 7181663 (2007-02-01), Hildebrant
patent: 2002/0196029 (2002-12-01), Schmidt
patent: 2003/0001725 (2003-01-01), Moore
patent: 2005/0138499 (2005-06-01), Pileggi et al.
patent: 2006/0132167 (2006-06-01), Chen
patent: 2006/0252375 (2006-11-01), Wu et al.
patent: 2006/0282735 (2006-12-01), Weinraub et al.
patent: 2007/0026809 (2007-02-01), Zhang et al.
patent: 2008/0116910 (2008-05-01), Hung
patent: 2008/0152357 (2008-06-01), Okayasu et al.
patent: 2009/0153158 (2009-06-01), Dunn et al.
patent: 090107845 (2002-12-01), None
patent: 88103352 (2004-04-01), None
Liou et al., “A prototype of a wireless-based test system”, 2007, IEEE SOC Conference 2007, pp. 225-228.

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