Probeless testing of pad buffers on wafer

Details Probeless testing of pad buffers on wafer Probeless testing of pad buffers on wafer

2008-07-30

2009-08-11

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

07574641

ABSTRACT:
The peripheral circuitry (350, 360, ESD, BH) of an integrated circuit die on a wafer is tested without physically contacting the bond pads of the die.

REFERENCES:
patent: 4875003 (1989-10-01), Burke
patent: 5115191 (1992-05-01), Yoshimori
patent: 5173904 (1992-12-01), Daniels et al.
patent: 5206584 (1993-04-01), Nishimori
patent: 5519355 (1996-05-01), Nguyen
patent: 5621739 (1997-04-01), Sine et al.
patent: 5736849 (1998-04-01), Terayama
patent: 5938783 (1999-08-01), Whetsel
patent: 6199182 (2001-03-01), Whetsel
patent: 6408410 (2002-06-01), Needham
“1149.1 scan control transport levels” by Gage, R This paper appears in: Test Conference, 1994. Proceedings., International Publication Date: Oct. 2-6, 1994 On p. 1022 ISBN: 0-7803-2103-0 INSPEC Accession No. 4847079.
“Design for testability in a 200 MFLOPS vector-pipelined processor(VPP)-ULSI” by Hagihara et al. This paper appears in: Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No. TH0458-0) Publication Date: Nov. 26-27, 1992 On pp. 223-228 ISBN: 0-8186-2985-1 INSPEC Accession No. 4432442.
“A universal technique for accelerating simulation of scan test patterns” by Oomman et al.This paper appears in: Test Conference, 1996. Proceedings., International Publication Date: Oct. 20-25, 1996 On pp. 135-141 Meeting Date: Oct. 20, 1996-Oct. 25, 1996 ISBN: 0-7803-3541-4 INSPEC Accession No. 5539838.

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