Program, test apparatus and testing method

Details Program, test apparatus and testing method Program, test apparatus and testing method

2007-06-05

2007-06-05

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

10954727

ABSTRACT:
A recording medium has a program recorded to operate a testing apparatus for testing an electronic device. The program causes the testing apparatus to perform functions as a comparing unit for comparing an output signal from the electronic device with an expected value, a timing generating unit for generating a rate signal and providing the comparing unit with the rate signal, wherein the rate signal determines timing at which the comparing unit compares the output signal with the expected value, a fail memory for saving the comparison results obtained by comparing the output signal with the expected value successively according to the rate signal to different addresses, and a period calculating unit for calculating a period of the output signal based on the comparison results stored successively in the fail memory, when executing a test for measuring the period of the output signal.

REFERENCES:
patent: 6099161 (2000-08-01), Furlan
patent: 6324485 (2001-11-01), Ellis
patent: 7079971 (2006-07-01), Fukuda
patent: 3-71197 (1991-03-01), None
patent: 4-250508 (1992-09-01), None
International Search Report and Written Opinion of The International Searching Authority issued for International Application No. PCT/JP2005/018594 mailed on Dec. 14, 2005, 10 pages.
Patent Abstracts of Japan, Publication No. 03071197, Publication Date: Mar. 26, 1991, 1 page.
Patent Abstracts of Japan, Publication No. 04250508, Publication Date: Sep. 7, 1992, 1 page.

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