Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1998-10-13
1999-08-17
Canney, Vincent P.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
G06F 1100
Patent
active
059387815
ABSTRACT:
A production operator interface is created using self-contained ActiveX controls each of which provide an interface to a specific part of the overall test system. These controls all communicate among themselves automatically. The production interface uses an ActiveX "tester control" which provides an application programming interface to the rest of the software control system. A library of self-contained ActiveX controls is provided which contains "operator controls" which may be "dragged and dropped" into an operator window to provide the operator with information and the ability to control the test system. In addition a semiconductor test system needs to be adapted to work with one or more different packaged device handlers or wafer probers which position a semiconductor device for testing by the tester. An ActiveX operator control allows an operator to select a handler driver from a library of handler drivers.
REFERENCES:
Daponte P et al: "Object-Oriented Design of Measurement Systems," Proceedings of the Instrumentation and Measurement Technology Conference, New York, May 12-14, 1992, May 12, 1992, pp. 243-248, XP000344047, Institute of Electrical and Electronics Engineers.
Dewald Gee G E et al: "Ada Software Support Environment for Test," Advancing Mission Accomplishment, San Antonio, Sep. 17-20, 1990, No. conf. 26, Sep. 17, 1990, pp. 239-246, XP000201781, Institute of Electrical and Electronics Engineers.
Chappell D et al: "Activex Demystified," Byte, vol. 22, No. 9, Sep. 1997, pp. 56-62, XP000726365, pp. 61-62.
Canney Vincent P.
Teradyne, Inc.
Walsh Edmund J.
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