Program-controlled unit and method for identifying and/or...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S736000

Reexamination Certificate

active

07089468

ABSTRACT:
The program-controlled unit, during the execution of the program, can switch itself to a state in which selected elements that can be connected to form scan chains or all of the elements can no longer change their state, according to a predetermined result. If these elements are then connected to form a scan chain and read out, the data obtained as a result can be used to identify and/or analyze any errors existing in the program-controlled unit rapidly and reliably.

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S. Narayanan et al., “Reconfigurable scan chains: A novel approach to reduce test application time”, Proceedings of ICCAD, p. 710-715, Sep. 1993.
Narayanan, S. and Breuer, M.A.; Reconfiguration techniques for a single scan chain; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.: 14 Issue: 6, Jun. 1995, pp. 750-765.
IBM Technical Disclosure Bulletin (TDB-ACC-NO) NA9003105 “Programmable Microcoded Self-Test Apparatus for Processor Cache Memory” Mar. 1990, US, vol. 32, Issue 10A, pp. 105-107, publication date Mar. 1, 1990.

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