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Method and apparatus for ABIST diagnostics

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for accelerating through-the pins LBIST...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for accessing hidden data in a boundary...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for adaptive clocking for boundary scan...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for affecting a portion of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for affecting a portion of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for an easy identification of a state...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for an efficient memory built-in self...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for an embedded time domain...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for analyzing delay defect

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for at-speed testing of digital circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for at-speed testing of digital circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for automated generation of expected...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for automated generation of expected...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for automated testing of circuit boards

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for automatic generation of system test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for automatic scan completion in the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for automatically inputting debugging data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for automatically testing electronic compon

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for automating security functions in a comp

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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