Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-02-27
2007-02-27
Torres, Joseph D. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S733000
Reexamination Certificate
active
10157094
ABSTRACT:
In one embodiment, an integrated circuit which uses one or more re-useable modules may use a signature generated by a duplicate state machine or an unmodified state machine to select, control, or otherwise affect a resource on the integrated circuit, where affecting the resource was not part of the original design and state diagram of the unmodified state machine. In one embodiment, a method and apparatus is provided for dynamically reconfiguring a plurality of test circuits in re-useable modules on an IC without modifying the controller state machine in the re-usable module.
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Bruce, Jr. William C.
Moyer William C.
Chiu Joanna G.
Freescale Semiconductor Inc.
Hill Susan C.
Torres Joseph D.
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