Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-08-21
2007-08-21
Lamarre, Guy (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S025000, C714S030000, C714S042000, C714S718000, C714S734000, C714S742000, C365S201000
Reexamination Certificate
active
10869698
ABSTRACT:
A memory BIST architecture provides an efficient communication interface between external agents, e.g., external tester and a memory BIST module. The memory BIST architecture reduces diagnostics efforts by dividing the search space and allowing the test and debug to be concentrated on the failing memory. The memory BIST architecture is divided into two levels, a memory BIST sequencer level and a satellite memory BIST module. The memory BIST sequencer level includes a set of registers that provide an interface between external agents attempting to communicate with the MBIST module and the Satellite MBIST module.
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House Kenneth A.
Obaidulla Syed A.
Zarrineh Kamran
Dorsey & Whitney LLP
Lamarre Guy
Sun Microsystems Inc.
Trimmings John P
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