Method and apparatus for automatic generation of system test...

Details Method and apparatus for automatic generation of system test... Method and apparatus for automatic generation of system test...

2006-03-06

2009-02-24

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S004110, C714S025000, C714S043000, C714S713000, C714S735000, C714S742000, C717S163000, C717S171000, C717S176000

Reexamination Certificate

active

07496815

ABSTRACT:
An apparatus and associated methodology are provided to generate system test libraries for solution testing involving heterogeneous devices from different vendors. A unified user interface employs received information to execute the tests based on provided device and network topology libraries, generating the system library to perform the required end-to-end system testing. The unified user interface and the library generation mechanism provide a layer of abstraction avoiding complexities of the system configuration commands native to disparate devices.

REFERENCES:
patent: 5854889 (1998-12-01), Liese et al.
patent: 6158031 (2000-12-01), Mack et al.
patent: 6654911 (2003-11-01), Miles
patent: 6892154 (2005-05-01), Lee
patent: 7010782 (2006-03-01), Narayan et al.
patent: 7055138 (2006-05-01), Sutton
patent: 7237161 (2007-06-01), Volz
patent: 7284177 (2007-10-01), Hollander et al.
patent: 2002/0162059 (2002-10-01), McNeely et al.
patent: 2003/0191590 (2003-10-01), Narayan et al.
patent: 2003/0208616 (2003-11-01), Laing et al.
patent: 2004/0073890 (2004-04-01), Johnson et al.
patent: 2004/0205406 (2004-10-01), Kaliappan et al.
patent: 2007/0208984 (2007-09-01), Hayhow et al.
patent: 2007/0220392 (2007-09-01), Bhaumik et al.
patent: 2007/0245198 (2007-10-01), Betawar et al.
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