Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-08-08
2006-08-08
Decady, Albert (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
07089469
ABSTRACT:
The invention relates to a method for testing and commissioning an electrical circuit unit (integrated circuit, module, device), and the electrical circuit unit. Test signals are exchanged, via an electrical test interface between the environment of the circuit unit and a test circuit unit contained in the circuit unit. Tests are carried out by the test circuit unit within the circuit unit. The tests are initiated externally by test signals and the results of the tests are transmitted externally via test signals. At the end of the tests, a reconfiguration of the test circuit unit is carried out in such a way that the circuit parts initially required for the test circuit unit undertake normal operating tasks of the circuit unit after the subsequent commissioning.
REFERENCES:
patent: 5781485 (1998-07-01), Lee et al.
patent: 6255838 (2001-07-01), Habersetzer et al.
patent: 6446230 (2002-09-01), Chung
patent: 0978726 (2000-02-01), None
Alcatel
De'cady Albert
Kerveros James C.
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