Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1997-09-26
1999-09-28
Hua, Ly V.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
714727, 714729, G06F 1700, G06F 1100
Patent
active
059580755
ABSTRACT:
A scannable sense amplifier is provided in which the transfer circuits are implemented using only a pair of NMOS transistors added to column pitched circuits between adjacent sense amplifiers.
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Hodges et al., "Analysis and Design of Digital Integrated Circuits"; McGraw-Hill Publishing Co., 1988, pp. 24-25,311.
Advanced Micro Devices , Inc.
Hua Ly V.
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