Apparatus for efficient LFSR calculation in a SIMD processor

Apparatus for making test data and method thereof

Apparatus for making test data and method thereof

Apparatus for on-line circuit debug using JTAG and shadow...

Apparatus for performing stuck fault testings within an...

Apparatus for scan testing of integrated circuits with scan...

Apparatus for selecting test patterns for logic circuit,...

Apparatus for testing a fixed logic value interconnection betwee

Apparatus for testing an interconnecting logic fabric

Apparatus for testing semiconductor integrated circuit

Apparatus for testing semiconductor integrated circuits

Apparatus for testing system-on-chip

Apparatus for use in detecting circuit faults during...

Apparatus with programmable scan chains for multiple chip...

Apparatus with self-test circuit

Apparatus within an integrated circuit for preventing the...

Apparatus, method, and signal-bearing medium embodying a...

Apparatus, method, and signal-bearing medium embodying a...

Application specific integrated circuit with internal testing

Application specified integrated circuit with user programmable