Apparatus with self-test circuit

Details Apparatus with self-test circuit Apparatus with self-test circuit

2006-09-19

2006-09-19

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S762010

Reexamination Certificate

active

07111218

ABSTRACT:
An apparatus is adapted for self-test. The apparatus includes a microcontroller and a number of relay drivers having outputs electrically connected to form a single input for self-test monitoring. The microcontroller is electrically connected to each of the relay drivers and is adapted to energize each of the relay drivers during self-test. The results of the self-test are monitored via a single input line to the microcontroller or by a single input line to a LED.

REFERENCES:
patent: 3548301 (1970-12-01), Zutkis
patent: 4158431 (1979-06-01), van Bavel et al.
patent: 4479117 (1984-10-01), Marquardt
patent: 4628443 (1986-12-01), Rickard et al.
patent: 4961051 (1990-10-01), Tjebben
patent: 5153522 (1992-10-01), Sano
patent: 5268635 (1993-12-01), Bortolini et al.
patent: 5444390 (1995-08-01), Bartlett et al.
patent: 5748644 (1998-05-01), Szabo
patent: 6087846 (2000-07-01), Alvord et al.
patent: 6188225 (2001-02-01), Tislaric
patent: 6192495 (2001-02-01), Totorica et al.
patent: 6314537 (2001-11-01), Oh
patent: 6754864 (2004-06-01), Gangl et al.
patent: 6918074 (2005-07-01), Kim et al.
patent: 6980005 (2005-12-01), Finlay et al.
patent: 2002/0019964 (2002-02-01), Zettler

Affiliated with

Also associated with

Rating

Apparatus with self-test circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus with self-test circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus with self-test circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3543413