Application specific integrated circuit with internal testing

Details Application specific integrated circuit with internal testing Application specific integrated circuit with internal testing

2007-09-04

2007-09-04

Lamarre, Guy (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S744000

Reexamination Certificate

active

11011232

ABSTRACT:
Application specific integrated circuits (ASICs) and methods are provided which allow for internal testing of an ASIC. One ASIC embodiment includes a processor on the ASIC. A memory is coupled to the processor. A test circuit is integrated on the ASIC and coupled to the processor to perform testing internal to the ASIC, the test circuit having an input to receive signals from the processor. The processor can read an output of the test circuit to determine a performance speed of the ASIC.

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