Apparatus with programmable scan chains for multiple chip...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S727000

Reexamination Certificate

active

07600168

ABSTRACT:
An apparatus provided with programmable scan chains includes a scan chain having a scan input port and a scan output port, a plurality of first I/O ports, an input port selector for selecting one of the plurality of first I/O ports to be coupled to the scan input port, a plurality of second I/O ports, an output port selector for selecting one of the plurality of second I/O ports to be coupled to said scan output port. Further, an apparatus provided with programmable scan chains includes N scan chains, each scan chain having a scan input port and scan output port, M first I/O ports, an input port selector for selecting N of the first I/O ports to be coupled to the N scan input ports, K second I/O ports, and an output port selector for selecting N of the second I/O ports to be coupled to the N scan output ports.

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