Flexible and extensible implementation of sharing test pins...
Flexible memory built-in-self-test (MBIST) method and apparatus
Flexible scan architecture
Flexible test environment for automatic test equipment
Flexible test environment for automatic test equipment
Flip flop circuit and apparatus using a flip flop circuit
Flip flop circuit and apparatus using a flip flop circuit
Flip flop circuit for scan test with two latch circuits
Flip-flop and scan path circuit
Flip-flop circuit for capturing input signals in priority order
Flip-flop, shift register, and scan test circuit
Format control circuit and semiconductor test device
Full scan solution for latched-based design
Full scan solution for latched-based design
Fully X-tolerant, very high scan compression scan test...
Functional block for integrated circuit, semiconductor...
Functional frequency testing of integrated circuits
Functional frequency testing of integrated circuits
Functional frequency testing of integrated circuits
Functional pattern logic diagnostic method