Functional pattern logic diagnostic method

Details Functional pattern logic diagnostic method Functional pattern logic diagnostic method

2005-06-25

2009-08-11

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S021000, C714S025000, C714S037000, C714S045000, C714S048000, C714S723000, C714S724000, C714S726000, C714S727000, C714S729000, C714S732000, C714S735000, C714S738000, C714S742000

Reexamination Certificate

active

07574644

ABSTRACT:
A method of diagnosing semiconductor device functional testing failures by combining deterministic and functional testing to create a new test pattern based on functional failure by determining the location of the type of error in the failing circuit. This is accomplished by identifying the failing vector during the functional test, observing the states of the failed device by unloading the values of the latches from the LSSD scan chain before the failing vector, generating a LOAD from the unloaded states of the latches, applying the generated LOAD as the first event of a newly created independent LSSD deterministic pattern, applying the primary inputs and Clocks that produced the failure to a correctly operating device, unloading the output of the correctly operating device to generate a deterministic LSSD pattern; and applying the generated deterministic LSSD pattern to the failing device to diagnose the failure using existing LSSD deterministic tools.

REFERENCES:
patent: 5396170 (1995-03-01), D'Souza et al.
patent: 5663967 (1997-09-01), Lindberg et al.
patent: 5907562 (1999-05-01), Wrape et al.
patent: 6725406 (2004-04-01), Kakizawa et al.

Affiliated with

Also associated with

Rating

Functional pattern logic diagnostic method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Functional pattern logic diagnostic method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Functional pattern logic diagnostic method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4117654