Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-10-03
2006-10-03
Kerveros, James C. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S727000, C327S202000
Reexamination Certificate
active
07117412
ABSTRACT:
A flip-flop circuit includes first and second logic gates, a first selection circuit and a latch circuit. The first logic gate executes a logic operation on a first data signal and a first control signal. The second logic gate executes a logic operation on a second data signal and the first control signal. The operation results of the first and second logic gates are forcibly fixed to a predetermined value irrespective of the first and second data signals, if the first control signal is asserted. A first selection circuit selects one of the operation results of the first and second logic gates, and outputs the selected operation result as a first selection signal. A latch circuit latches the first selection signal.
REFERENCES:
patent: 4740970 (1988-04-01), Burrows et al.
patent: 6614276 (2003-09-01), Robertson et al.
Morimoto Toshiki
Ogawa Ryuji
DLA Piper Rudnick Gray Cary US LLP
Kabushiki Kaisha Toshiba
Kerveros James C.
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