Functional frequency testing of integrated circuits

Details Functional frequency testing of integrated circuits Functional frequency testing of integrated circuits

2009-12-10

2010-11-23

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S727000, C714S729000, C714S731000, C713S400000, C713S501000

Reexamination Certificate

active

07840864

ABSTRACT:
A method and circuits for testing an integrated circuit at functional clock frequency by providing a test controller generating control signals that assure proper latching of test patterns in scan chains at tester frequency and propagation of the test pattern through logic circuits being tested at functional clock frequency.

REFERENCES:
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patent: 6763489 (2004-07-01), Nadeau-Dostie et al.
patent: 7058866 (2006-06-01), Flanagan et al.
patent: 7185249 (2007-02-01), Tkacik et al.
Notice of Allowance (Mail Date Nov. 30, 2009) for U.S. Appl. No. 11/772,340, filed Jul. 2, 2007; Confirmation No. 9415.
Office Action (Mail Date Mar. 4, 2010) for U.S. Appl. No. 12/635,068, filed Dec. 10, 2009; Confirmation No. 8664.

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