Test method and apparatus using energy consumption ratio

Test method and architecture for circuits having inputs

Test method and test circuit for electronic device

Test method for a semiconductor integrated circuit having a...

Test method for high speed semiconductor devices using a...

Test method of chips in a semiconductor wafer employing a test a

Test method of semiconductor intergrated circuit and test...

Test methodology based on multiple skewed scan clocks

Test mode circuit capable of surely resetting test mode signals

Test mode control circuit and method for using the same in...

Test mode features for synchronous pipelined memories

Test mode for pin-limited devices

Test mode setup circuit for microcontroller unit

Test mode soft reset circuitry and methods

Test output compaction for responses with unknown values

Test output compaction using response shaper

Test output compaction with improved blocking of unknown values

Test pattern compression for an integrated circuit test...

Test pattern compression for an integrated circuit test...

Test pattern compression for an integrated circuit test...