Test output compaction with improved blocking of unknown values

Details Test output compaction with improved blocking of unknown values Test output compaction with improved blocking of unknown values

2006-03-14

2009-10-27

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C714S720000, C714S728000, C714S729000, C714S738000, C714S739000

Reexamination Certificate

active

07610527

ABSTRACT:
Implementations of the present principles are directed to test output compaction arrangements and a methods of generating control patterns for unknown blocking. The specified bits in the control patterns, which when using linear feedback shift register (LFSR) reseeding determines control data volume and LFSR size, are preferably organized in a manner so as to balance the number of specified bits in the control patterns across test patterns.

REFERENCES:
patent: 6557129 (2003-04-01), Rajski et al.
patent: 6789221 (2004-09-01), Hapke
patent: 7197721 (2007-03-01), Patil et al.
patent: 7237162 (2007-06-01), Wohl et al.
patent: 7376873 (2008-05-01), Vranken et al.
Naruse et al., On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding, 2003, IEEE, pp. 1060-1068.
Zacharia et al., Decompression of Test Data Using Variable-Length Seed LFSRs, 1995, IEEE, pp. 426-433.
Wang et al., X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors, Jul. 2008, IEEE, vol. 57, No. 7, pp. 978-989.

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