Method for implementing priority encoders using FPGA carry logic

Method for implementing test generation for systematic scan...

Method for improving the efficiency of weighted random...

Method for inserting test circuit and method for converting...

Method for localization and generation of short critical...

Method for making a digital circuit testable via scan test

Method for microprocessor test insertion reduction

Method for minimizing ground bounce during DC parametric tests u

Method for monitoring virtual connections within a digital telec

Method for on-line circuit debug using JTAG and shadow scan...

Method for operating a boundary scan cell design for high...

Method for operating a TAP controller and corresponding TAP...

Method for optimizing a pattern generation program, a...

Method for optimizing scan chains in an integrated circuit...

Method for optimizing test development for digital circuits

Method for optimizing test fixtures to minimize vector load...

Method for performing a logic built-in-self-test in an...

Method for performing a test case with a LBIST engine on an...

Method for performing ATPG and fault simulation in a...

Method for performing built-in and at-speed test in...