Method for operating a TAP controller and corresponding TAP...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S726000

Reexamination Certificate

active

06857091

ABSTRACT:
The present invention provides a method for operating a TAP controller having a first input terminal (Etms) for inputting a logic test mode selection signal (tms) and a second input terminal (Etrst) for inputting a logic reset signal (trst); the TAP controller being configured in such a way that it is in a test mode if the test mode selection signal (tms) has a first logic state (“0”), and it is in no test mode if the test mode selection signal (tms) has a second logic state (“1”), that it can be reset asynchronously by single application of the logic reset signal (trst) from the first logic state (“0”); the method having the following steps: provision of an external logic reset signal (reset_n): formation of a logic ORing of the external logic reset signal (reset_n) and the inverted logic test mode selection signal (tms) for the generation of the logic reset signal (trst); and application of the logic reset signal (trst) generated by the logic ORing to the second input terminal (Etrst). The invention provides a corresponding TAP controller.

REFERENCES:
patent: 5323107 (1994-06-01), D'Souza
patent: 5404359 (1995-04-01), Gillenwater et al.
patent: 6073254 (2000-06-01), Whetsel
patent: 6711707 (2004-03-01), Haroun et al.
patent: 198 35 608 (2000-10-01), None
“The Institute of Electrical and Electronics Engineers: IEEE Standard Test Access Port and Boundary-Scan Architecture,” IEEE Standard 1149.1-1990, New York, 1990, S. 3-1 to 3-5, 5-1 to 8-8, and 5-16f.
Andrews, J., “IEEE Standard Boundary Scan 1149.1—An Introduction,” Electro International Conference Record, Western Periodicals Co., Ventura, California, vol. 16, pp. 522-527, XP000288428.

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