Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-01-25
2011-01-25
Gaffin, Jeffrey A (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S739000
Reexamination Certificate
active
07877655
ABSTRACT:
A method for performing a test case with at least one LBIST engine on an integrated circuit with a plurality of storage elements and logic circuits interconnected according to a predetermined scheme. The LBIST engine is partially built up by storage elements and/or logic circuits. At least one scan chain is formed as a series of selected storage elements and the other storage elements are used for the LBIST engine or a part of said LBIST engine in a testing mode. The scan chain is driven by a test pattern and the LBIST test case is testing those parts of the logic circuits corresponding to the storage elements of said scan chain.
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Bonsels Stefan
Le Thuyen
Padeffke Martin
Pflueger Thomas
Gaffin Jeffrey A
International Business Machines - Corporation
McMahon Daniel F
Schnurmann H. Daniel
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