Logic built-in self test (BIST)
Logic built-in self test selective signature generation
Logic built-in self-test channel skipping during functional...
Logic circuit and method for designing the same
Logic circuit and methods for designing and testing the same
Logic circuit protected against transient disturbances
Logic circuit test apparatus and logic circuit test method
Logic circuit testing with reduced overhead
Logic circuit verification apparatus and method for...
Logic circuit verification device for semiconductor integrated c
Logic circuitry and recording medium
Logic circuitry having self-test function
Logic device and method supporting scan test
Logic synthesis for testability system which enables improvement
Long running test method for a circuit design analysis
Look ahead scan chain diagnostic method
Look-ahead built-in self tests
Loop profiling by instrumentation
Loop-back method for measuring the interface timing of...
Loop-back method for measuring the interface timing of...