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Logic built-in self test (BIST)

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic built-in self test selective signature generation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic built-in self-test channel skipping during functional...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit and method for designing the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Logic circuit and methods for designing and testing the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit protected against transient disturbances

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit test apparatus and logic circuit test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit testing with reduced overhead

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit verification apparatus and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Utility Patent

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Logic circuit verification device for semiconductor integrated c

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Logic circuitry and recording medium

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuitry having self-test function

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic device and method supporting scan test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic synthesis for testability system which enables improvement

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Long running test method for a circuit design analysis

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Look ahead scan chain diagnostic method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Look-ahead built-in self tests

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Loop profiling by instrumentation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Loop-back method for measuring the interface timing of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Loop-back method for measuring the interface timing of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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