Logic circuit and methods for designing and testing the same

Details Logic circuit and methods for designing and testing the same Logic circuit and methods for designing and testing the same

2006-06-06

2006-06-06

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S736000

Reexamination Certificate

active

07058867

ABSTRACT:
A logic circuit comprising a flip-flop chain circuit which is utilized in a scan test of a combinational circuit, the flip-flop chain circuit including a plurality of flip-flops each of which is provided with a selector.

REFERENCES:
patent: 5812561 (1998-09-01), Giles et al.
patent: 6501288 (2002-12-01), Wilsher
patent: 6549478 (2003-04-01), Suzuki
patent: 6633502 (2003-10-01), Iwasaki
patent: 6760876 (2004-07-01), Grannis, III
patent: 9-5403 (1997-01-01), None

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