Clocking methodology for at-speed testing of scan circuits...
Clustering-based approach for coverage-directed test generation
Combinational test pattern generation method and apparatus
Combinational test pattern generation method and apparatus
Combinatorial at-speed scan testing
Combinatorial at-speed scan testing
Command multiplier for built-in-self-test
Common test logic for multiple operation modes
Communicating simultaneously a functional signal and a...
Communication element and communication apparatus using the...
Communication equipment with boundary scan elements
Communication interface for diagnostic circuits of an...
Communication interface for diagnostic circuits of an...
Communication signal testing with a programmable logic device
Communication signal testing with a programmable logic device
Communication system with boundary scan elements
Communication system, a synchronization circuit, a method of...
Communications jacks including test circuits and related...
Compacting circuit responses
Compacting circuit responses