Testing of a programmable device

Testing of circuit with plural clock domains

Testing of data retention latches in circuit devices

Testing of data retention latches in circuit devices

Testing of electronic circuits

Testing of high speed DDR interface using single clock edge...

Testing of integrated circuit devices

Testing of integrated circuit devices

Testing of integrated circuits

Testing of integrated circuits using boundary scan

Testing of modules operating with different characteristics...

Testing of replicated components of electronic device

Testing propagation delay of a shift register using a ring...

Testing regularly structured logic circuits in integrated...

Testing replicated sub-systems in a yield-enhancing...

Testing synchronization circuitry using digital simulation

Testing system and methods with protocol pattern injection...

Testing system for a device under test

Testing system for circuit board self-test

Testing system for evaluating integrated circuits, a burn-in tes