Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-10-22
2008-11-18
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S731000
Reexamination Certificate
active
07454675
ABSTRACT:
A method of testing a programmable device begins by programming at least a portion of the programmable device in accordance with at least a portion of an application to produce a programmed circuit, wherein the programmed circuit includes an input sequential element and an output sequential element. The method continues by providing a test input to the programmed circuit. The method continues by triggering the input sequential element to temporarily store the test input based on a first edge of the test clock. The method continues by triggering the output sequential element to temporarily store a test output of the programmed circuit based on a second edge of the test clock. The method continues by capturing the test output of the programmed circuit in accordance with the second edge of the test clock.
REFERENCES:
patent: 5488612 (1996-01-01), Heybruck
patent: 5867507 (1999-02-01), Beebe et al.
patent: 6003150 (1999-12-01), Stroud et al.
patent: 6038192 (2000-03-01), Clinton et al.
patent: 6084930 (2000-07-01), Dinteman
patent: 6694464 (2004-02-01), Quayle et al.
patent: 6751762 (2004-06-01), Antonischki
patent: 6874107 (2005-03-01), Lesea
“An efficient reconfigurable architecture and implementation of edge detection algorithm using Handle-C” by Rao et al. This paper appears in: Information Technology: Coding and Computing, 2004. Proceedings. ITCC 2004. International Conference on Publication Date: Apr. 5-7, 2004 vol. 2, On pp. 843-847 vol. 2 ISBN: 0-7695-2108-8.
“Testing FPGA based reconfigurable system within run time applications” by Doumar et al. This paper appears in: The 13th International Conference on Microelectronics, 2001. ICM 2001 Proceedings. Publication Date: Oct. 29-31, 2001 On pp. 234-236 ISBN: 0-7803-7522-X INSPEC Accession No. 7360718.
Bapat Shekhar
Payakapan Tassanee
Toutounchi Shahin
Wells Robert W.
Britt Cynthia
Markison Timothy W.
Wallace Michael T.
Xilinx , Inc.
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