Testing system for a device under test

Details Testing system for a device under test Testing system for a device under test

2008-01-14

2010-10-05

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S025000, C714S740000, C714S742000, C714S733000, C714S712000, C714S724000, C324S755090, C702S117000, C702S124000

Reexamination Certificate

active

07810006

ABSTRACT:
A testing system for a device under test (DUT) includes a test parameter-generating device and a platform module. The test parameter-generating device stores test information, and is operable so as to execute a test algorithm, so as to generate a transmission signal upon execution of the test algorithm, and so as to generate a test environment with reference to the transmission signal. The platform module is operable so as to conduct testing of the DUT using the test information stored in the test parameter-generating device under the test environment generated by the test parameter-generating device.

REFERENCES:
patent: 5023791 (1991-06-01), Herzberg et al.
patent: 5477160 (1995-12-01), Love
patent: 6198274 (2001-03-01), Onishi
patent: 6701474 (2004-03-01), Cooke et al.
patent: 2008/0189580 (2008-08-01), Kim et al.

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