Testing of integrated circuit devices

Details Testing of integrated circuit devices Testing of integrated circuit devices

2006-09-05

2006-09-05

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S819000, C713S401000

Reexamination Certificate

active

07103815

ABSTRACT:
An integrated circuit device includes a data buffer, coupled to an external connector, providing a data signal on the external connector. A test buffer, coupled to the data buffer, receives the data signal and provides a testing output signal to a delay circuit. The delay circuit receives the testing output signal at a first clock rate internal to the integrated circuit device and compares test data in the testing output signal to expected test signal values. The delay circuit provides a result to an external connector at a second clock rate that is slower than the first clock rate.

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