Automatic test equipment using sigma delta modulation to...
Automatic test pattern generation for functional register...
Automatic test system with synchronized instruments
Automatic testing for programmable networks of control signals
Automatic testing of microprocessor bus integrity
Automatic testing of microprocessor bus integrity
Automatically determining test patterns for a netlist having mul
Automaton synchronization during system verification
Autonomic bus reconfiguration for fault conditions
Autonomous self-monitoring and corrective operation of an...
Avoiding race conditions at clock domain crossings in an...
Bandwidth matching for scan architectures in an integrated...
BDX data in stable states
Bidirectional horizontal scan circuit with sub-sampling and...
Binary time-frame expansion of sequential systems
Bist architecture for detecting path-delay faults in a sequentia
BIST circuit for LSI memory
BIST memory test system
BIST scan path parts with test generator and compactor...
Bit synchronizers and methods of synchronizing and...