Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-02-24
2008-12-30
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S704000
Reexamination Certificate
active
07472320
ABSTRACT:
Disclosed is a method and apparatus for autonomously self-monitoring and self-adjusting the operation of an integrated circuit device throughout the integrated circuit device's useful life. The invention periodically performs performance self-testing on the integrated circuit device throughout the integrated circuit devices useful life. The invention also evaluates whether results from the self-testing are within acceptable limits and self-adjusts parameters of the integrated circuit device until the results from the self-testing are within the acceptable limits.
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IBM TDB NN9211102 Method of Applying, Monitoring and Recording Multiple Test Criteria vol. 35 Issue 6 p. 102-114 Pub Date Nov. 1, 1992.
Berndlmaier Zachary E.
Geissler Stephen F.
Tonti William R.
Britt Cynthia
Gibb & Rahman, LLC
International Business Machines - Corporation
LeStrange, Esq. Michael
LandOfFree
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