Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-03-22
2005-03-22
Tu, Christine T. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C716S030000
Reexamination Certificate
active
06871310
ABSTRACT:
A processing system provides for analysis of sequential systems using binary time-frame expansion of these systems. This expansion technique produces models in which inputs and values for time may be treated as variables for producing various outputs and states.
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Baker & Botts L.L.P.
Fujitsu Limited
Tu Christine T.
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