LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery,Pulse or data error handling,Digital logic testing

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Semiconductor device for accurate measurement of time...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device for testing semiconductor process and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device having integrally sealed integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device having plural clock domains which...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device having test mode entry circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device including macros and its testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device inspection apparatus and semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device provided with a boundary-scan test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device tested using minimum pins and methods...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Semiconductor device testing apparatus and method for testing me

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Semiconductor device testing apparatus and signal output...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device testing apparatus capable of high speed tes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Semiconductor device with boundary scanning circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with self-test circuits and test method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with speed binning test circuit and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with termination resistor circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor device with termination resistor circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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