Semiconductor device with termination resistor circuit

Details Semiconductor device with termination resistor circuit Semiconductor device with termination resistor circuit

2005-11-29

2008-09-02

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C326S030000

Reexamination Certificate

active

07421631

ABSTRACT:
A semiconductor device includes a signal line, a test load circuit and a termination circuit. The signal line is connected with an input/output node of the semiconductor device. The test load circuit has a test resistor and is provided between the signal line and a first one of power lines to connect the signal line to the first power line through the test resistor in response to a test start signal. The termination circuit has first and second resistors, and is provided between the first power line and a second power line as the other power line to disconnect the signal line from the first and second power lines in response to the test start signal. Also, the test load circuit disconnects the signal line from the first power line in response to a test end signal, and the termination circuit connects the signal line with the first and second power lines through the first and second resistors in response to the test end signal.

REFERENCES:
patent: 6812735 (2004-11-01), Pham
patent: 6961883 (2005-11-01), Tsuji
patent: 7102381 (2006-09-01), Chen et al.
patent: 7193431 (2007-03-01), Miyake et al.
patent: 7197684 (2007-03-01), Fang et al.
patent: 7205788 (2007-04-01), Wang et al.
DDR-2 SDRAM Technology and Design Trends (DesignCon 2003), High Performance System Design Conference, 2003.

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