Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1997-06-13
2000-01-18
Beausoliel, Jr., Robert W.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
G01R 3128
Patent
active
060165650
ABSTRACT:
A strobe generator includes four strobe pulse generators generating original strobe pulses having the same frequency, respectively, and correspondingly, four logical comparator circuits, the number of which is identical to that of the strobe pulse generators. Further, a mode selection circuit is provided which can set any one of mode 1, mode 2 and mode 3. In mode 1, an output signal V from a level comparator is latched by a new high speed strobe signal having a frequency four times the frequency of the original strobe pulse, and the latched signals are sequentially compared with expected value data signals. In mode 2, an output signal V from the level comparator is latched by two new high speed strobe signals having a frequency two times the frequency of the original strobe pulse, and the latched signals are sequentially compared with the expected value data signals. In mode 3, an output signal V from the level comparator is latched by four new strobe signals having the same frequency as the frequency of the original strobe pulse and different phases from one another, and the latched signals are sequentially compared with the expected value data signals.
REFERENCES:
patent: 5191281 (1993-03-01), Ohashi
patent: 5305329 (1994-04-01), Sasaki
patent: 5471484 (1995-11-01), Kawasaki
patent: 5539699 (1996-07-01), Sato et al.
patent: 5579251 (1996-11-01), Sato
patent: 5590137 (1996-12-01), Yamashita
patent: 5604756 (1997-02-01), Kawata
patent: 5646948 (1997-07-01), Kobayashi et al.
patent: 5659553 (1997-08-01), Suzuki
patent: 5732047 (1998-03-01), Niijima
Advantest Corporation
Beausoliel, Jr. Robert W.
Iqbal Nadeem
LandOfFree
Semiconductor device testing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device testing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device testing apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-570718