Semiconductor device testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

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G01R 3128

Patent

active

060165650

ABSTRACT:
A strobe generator includes four strobe pulse generators generating original strobe pulses having the same frequency, respectively, and correspondingly, four logical comparator circuits, the number of which is identical to that of the strobe pulse generators. Further, a mode selection circuit is provided which can set any one of mode 1, mode 2 and mode 3. In mode 1, an output signal V from a level comparator is latched by a new high speed strobe signal having a frequency four times the frequency of the original strobe pulse, and the latched signals are sequentially compared with expected value data signals. In mode 2, an output signal V from the level comparator is latched by two new high speed strobe signals having a frequency two times the frequency of the original strobe pulse, and the latched signals are sequentially compared with the expected value data signals. In mode 3, an output signal V from the level comparator is latched by four new strobe signals having the same frequency as the frequency of the original strobe pulse and different phases from one another, and the latched signals are sequentially compared with the expected value data signals.

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patent: 5732047 (1998-03-01), Niijima

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