Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-04-03
2009-10-13
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S030000, C714S733000, C714S734000, C714S736000, C714S742000, C714S745000, C700S108000, C438S014000, C702S182000, C257S048000, C324S500000, C324S765010
Reexamination Certificate
active
07603598
ABSTRACT:
A semiconductor device for testing a semiconductor process applied to manufacturing the semiconductor device is disclosed. The semiconductor device includes at least a testing group. The testing group includes a first testing block and a second testing block. The first testing block includes: a first input node; a first output node; a plurality of first selecting nodes; a first reference device, coupled to the first input node and the first output node; and a first target device, coupled to the first selecting nodes and the first output node. The second testing block includes: a second input node; a second output node; a plurality of second selecting nodes; a second reference device, coupled to the second input node and the second output node; and a second target device, coupled to the second selecting nodes and the second output node.
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Chang Chin-Yi
Chang Yi-Hua
Hong Chia-Nan
Faraday Technology Corp.
Hsu Winston
Trimmings John P
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