Method and apparatus for high speed IC test interface

Method and apparatus for high update rate integrated circuit...

Method and apparatus for high-speed interconnect testing

Method and apparatus for holding failing information of a...

Method and apparatus for implementing enhanced LBIST...

Method and apparatus for implementing multiple remote...

Method and apparatus for improving fault test coverage for...

Method and apparatus for improving stuck-at fault detection...

Method and apparatus for improving testability of I/O...

Method and apparatus for improving timing accuracy of a semicond

Method and apparatus for improving transition fault...

Method and apparatus for integrated flip-flop to support two...

Method and apparatus for isolating faulty semiconductor...

Method and apparatus for limited access circuit test

Method and apparatus for limiting power dissipation in test

Method and apparatus for locating critical speed paths in integr

Method and apparatus for logic testing an integrated circuit

Method and apparatus for looping back a current state to...

Method and apparatus for low overhead circuit scan

Method and apparatus for low-pin-count scan compression