Method and apparatus for low overhead circuit scan

Details Method and apparatus for low overhead circuit scan Method and apparatus for low overhead circuit scan

2006-05-16

2006-05-16

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

07047468

ABSTRACT:
A method and system for manipulating data in a state holding elements array. Process data is moved through the state holding elements array by a process controller. A separate scan controller scans data out of the state holding elements array by scanning data out of a group of cascaded latches where there are insufficient extra state holding elements in the group to enable normal scan. A multiplicity of local scan clocks are utilized to shift selected amounts of data only when a next state holding element in the group has been made available by clearing the contents of that next state holding element. In this way, any given latch, for the purpose of scan, is not a dedicated master or slave latch, but can act as either. This invention also addresses a circuit for the creation of the multiplicity of local clocks from a conventional LSSD clock source.

REFERENCES:
patent: 5383143 (1995-01-01), Crouch et al.
patent: 5939916 (1999-08-01), Jamal et al.
patent: 6049488 (2000-04-01), Sawada
patent: 6327071 (2001-12-01), Kimura
patent: 6748564 (2004-06-01), Cullen et al.
patent: 6848060 (2005-01-01), Cook et al.
patent: 6934782 (2005-08-01), Stuber et al.
Hans Jacobson, et al.,Synchronous Interlocked Pipelined CMOS, IBM Corporation, pp. 1-12.
Eric Mercer, et al.,Stochastic Cycle Period Analysis in Timed Circuits, Electrical Engineering Department—University of Utah, pp. 1-4, Salt Lake City, Utah.

Affiliated with

Also associated with

Rating

Method and apparatus for low overhead circuit scan does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for low overhead circuit scan, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for low overhead circuit scan will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3566332